TECPS 2017- Proceedings of the 1st ACM SIGSOFT International Workshop on Testing Embedded and Cyber-Physical Systems
Full Citation in the ACM Digital Library
SESSION: Papers
Discovering instructions for robust binary-level coverage criteria
Vaibhav Sharma
Taejoon Byun
Stephen McCamant
Sanjai Rayadurgam
Mats P. E. Heimdahl
Testing uncertainty of cyber-physical systems in IoT cloud infrastructures: combining model-driven engineering and elastic execution
Hong-Linh Truong
Luca Berardinelli
Fault injection in the internet of things applications
Mohammad Amin Alipour
Towards automated composition of heterogeneous tests for cyber-physical systems
Alex Groce
Paul Flikkema
Josie Holmes